Electron backscattering diffraction as a complementary analytical approach to the microstructural characterization of ancient materials by electron microscopy
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چکیده
منابع مشابه
Nano-structural Characterization of Post-annealed ZnO Thin Films by X-ray Diffraction and Field Emission Scanning Electron Microscopy
ZnO thin films were deposited on Si(400) substrates by e-beam evaporation technique, and then post-annealed at different annealing temperatures (200-800°C). Dependence of the crystallographic structure, nano-strain, chemical composition and surface physical Morphology of these layers on annealing temperature were studied. The crystallographic structure of films was studied using X-Ray Diffracti...
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ژورنال
عنوان ژورنال: TrAC Trends in Analytical Chemistry
سال: 2015
ISSN: 0165-9936
DOI: 10.1016/j.trac.2015.03.026